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Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki*; Hanaya, Hiroaki; Tachibana, Hiroyuki*
Radiation Physics and Chemistry, 68(6), p.975 - 980, 2003/12
Times Cited Count:2 Percentile:18.9(Chemistry, Physical)Four kinds of film dosimeters well-characterized for low LET radiations were applied to 3-45 MeV/u ions. The dose responses relative to those for low LET radiations are almost one up to about 10 MeV/(mg/cm) and gradually become smaller with increase of the stopping power. Overall uncertainty in ion beam dosimetry using these characterized dosimeters is better than 5%(1) including uncertainty in fluence measurement(2%). Lateral and depth dose profile measurements were achievable using characterized Gafchromic dosimeters with the spatial resolution of better than 1 and 10 m, respectively.
Okayasu, Satoru; Sasase, Masato; Hojo, Kiichi; Chimi, Yasuhiro; Iwase, Akihiro; Ikeda, Hiroshi*; Yoshizaki, Ryozo*; Kambara, Tadashi*; Sato, H.*; Hamatani, Yutaro*; et al.
Physica C, 382(1), p.104 - 107, 2002/10
Times Cited Count:28 Percentile:75.35(Physics, Applied)no abstracts in English
Vacik, J.; Hnatowicz, V.*; Cervena, J.*; Naramoto, Hiroshi; Yamamoto, Shunya; Fink, D.*
Fullerene Science and Technology, 9(2), p.197 - 209, 2001/05
In this work, the stopping cross sections of 1H, 3H, 4He and 7Li were measured by Rutherford backscattering, Neutron depth profiling and alpha spectroscopy on fullerite on Si and steel. In addition, ion transmission through a thin Carbon film was also utilized. The measured stopping cross sections follow the theoretical predictions calculated for carbon, but are systematically higher than the theoreticqal values. The observed deviation can be explained by the chemical state of effects. The measured energy straggling exceeds Bohr's value, and this is reasobably explained by the thickness variation.
Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Tachibana, Hiroyuki
IAEA-TECDOC-1070, p.197 - 202, 1999/03
no abstracts in English
*; Tomimitsu, Hiroshi; *; *; *; Aizawa, Kazuya; Okayasu, Satoru; *; Kazumata, Yukio*; Y.C.Jiang*; et al.
Japanese Journal of Applied Physics, Part 1, 36(12A), p.7296 - 7301, 1997/12
Times Cited Count:6 Percentile:36.76(Physics, Applied)no abstracts in English
Goppelt-Langer, P.*; Yamamoto, Shunya; Aoki, Yasushi; Takeshita, Hidefumi; Naramoto, Hiroshi
Nuclear Instruments and Methods in Physics Research B, 118(1), p.7 - 10, 1996/09
Times Cited Count:7 Percentile:55.21(Instruments & Instrumentation)no abstracts in English
Takada, Hiroshi
Journal of Nuclear Science and Technology, 33(4), p.275 - 282, 1996/04
Times Cited Count:19 Percentile:81.64(Nuclear Science & Technology)no abstracts in English
Nakane, Yoshihiro; Furihata, Shiori*; Iwai, Satoshi*; Tanaka, Shunichi
JAERI-M 93-152, 178 Pages, 1993/08
no abstracts in English
; ; ;
Appl.Radiat.Isot., 37(2), p.121 - 125, 1986/00
no abstracts in English
Ono, Shinichi; ;
Bulletin of the Chemical Society of Japan, 59(6), p.1947 - 1951, 1986/00
Times Cited Count:2 Percentile:25.2(Chemistry, Multidisciplinary)no abstracts in English
; Ono, Shinichi
Bulletin of the Chemical Society of Japan, 58, p.1831 - 1832, 1985/00
Times Cited Count:1 Percentile:22.47(Chemistry, Multidisciplinary)no abstracts in English
; ; ; *
Journal of the Physical Society of Japan, 54(5), p.1750 - 1756, 1985/00
Times Cited Count:7 Percentile:58.86(Physics, Multidisciplinary)no abstracts in English
*; *; *; Kawatsura, Kiyoshi; Ozawa, K.; *
Japanese Journal of Applied Physics, 22(8), p.1306 - 1309, 1983/00
Times Cited Count:1 Percentile:11.45(Physics, Applied)no abstracts in English
;
Int.J.Appl.Radiat.Isot., 32, p.233 - 237, 1981/00
no abstracts in English
JAERI-M 9151, 36 Pages, 1980/10
no abstracts in English
*; *;
Oyo Butsuri (Sosetsu), 45(1), p.2 - 17, 1976/01
None
Ono, Shinichi
Bulletin of the Chemical Society of Japan, 48(7), p.2229 - 2230, 1975/07
Times Cited Count:1no abstracts in English
Ono, Shinichi; ; *; *
Bulletin of the Chemical Society of Japan, 48(7), p.2153 - 2157, 1975/07
Times Cited Count:18no abstracts in English